Principles of semiconductor network testing Afshar, Amir.
Publisher: Butterworth-Heinemann. ; 1995Description: xiv, 213 pagesISBN: 0-7506-9472-6Subject(s): Integrated circuits -- testingDDC classification: 621.3815 Ad8p 1995| Item type | Current location | Home library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Sibalom | Sibalom MCIR | Main-Circulation | 621.3815 Ad8p 1995 (Browse shelf) | Available | UAMAIN 22264 |
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| 621.38132 M432 2010 Introduction to digital microelectronic circuits | 621.38133 S47125 2015 Semiconductor terahertz technology: devices and systems at room temperature operation | 621.3815 1998 Fundamentals of linear electronics : integrated and discrete | 621.3815 Ad8p 1995 Principles of semiconductor network testing | 621.3815 B3111 2024 Basic of semiconductors / | 621.3815 B4711 2015 Modern diesel technology : diesel engines | 621.3815 B54e 2003 Electronics : circuits and systems |
600 Technology (App Sciences)
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