Principles of semiconductor network testing 
Afshar, Amir. 
 -  Butterworth-Heinemann.  1995 
 - xiv, 213 pages. 
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<br/><br/><label>ISBN: </label>0-7506-9472-6 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits -- testing.
<br/><br/><label>Dewey Class. No.: </label>621.3815 Ad8p 1995