Principles of semiconductor network testing Afshar, Amir.

Publisher: Butterworth-Heinemann. ; 1995Description: xiv, 213 pagesISBN: 0-7506-9472-6Subject(s): Integrated circuits -- testingDDC classification: 621.3815 Ad8p 1995
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Item type Current location Home library Collection Call number Status Date due Barcode Item holds
Book Book Sibalom
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MCIR 		Main-Circulation 621.3815 Ad8p 1995 (Browse shelf) Available UAMAIN 22264
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600 Technology (App Sciences)

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